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Study of the D NA sample for atomic force microscopy
C AI Ming 2hui
1,2
,ZH AO K ui
1,3
,ZH AN Y ong 2,NI Mei 2nan 1,S UI Li 1,K ONG Fu 2quan 1,Y ANG Ming 2jian
1,2
(1China Institute of Atomic Energy ,Beijing 102413;2School of Science ,Hebei University of T echnology ,T ianjin 300130;3The K ey Laboratory of Beam T echnology and M odification of Ministry of Education ,Beijing N ormal University ,Beijing 100875,China )Abstract :The key point of AF M application is the preparation of the sample.Several methods of preparing DNA sample were introduced in this paper.T w o methods were developed experimentally for the length measurement of DNA and the fragments induced by radiation ,as well as statistical analysis.The APS 2mica and bare mica were used as substrates respectively.K eyw ords :atomic force microscopy ;plasmid DNA ;sample preparation ;APS 2mica ;mica
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7第1期蔡明辉等:AF M 的DNA 样品制备技术研究
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