a. 压接底部的毛刺宽度不超过0.1mm（对于压接高度准确的，推荐毛刺高度不超过压线脚
的最低位置，见图）
b. 毛刺不能对随后的操作产生有害的影响。对于使用垫子密封的情况需特别注意。 3.绝缘体压线脚的截面图 理想的绝缘体压线脚截面 对称
没有刺伤线皮
绝缘体压线脚充分包住线皮
一些不标准的压线脚的例子包括：“T”字型，方形，“B”字型 参考供应商关于非标准绝缘体压接的接收和拒收标准。 能够接受的绝缘体压接：
绝缘体压线脚接触到芯线但没有损坏芯线 绝缘体压线脚两边没有闭合并且线皮往外逸 不能接收的绝缘体压线脚：
绝缘体压线脚的一边或两边压到绝缘体压线脚的底部或其他内表面。 绝缘体压线脚的一边或两边刺入弄伤芯线 线皮被弄伤裂开 不充分的应力释放 4.电缆线密封
不能弄伤或切入电缆线密封环或导线组件密封环，绝缘体压线脚的两边不能刺入密封环。 端子和导线设计时必须注意导线组件（端子和导线）穿过密封垫时不能损坏密封环。 4.4芯线压线脚的拉脱力测试 4.4.1目的
该步骤详细描述了关于测试拉脱力的标准方法。
该测试只是检查压线脚的机械性能而不能检查其电性能。 4.4.2设备
1.测量压接高度和压接宽度的设备
2.能够将绝缘体压线脚分开的设备（如果在压接时没有压接绝缘体压线脚，则该步骤可以省略） 3.测力计
4.剥线皮的设备，老虎钳，剪刀等工具 4.4.3 Samples
1. A minimum of 20 samples is required to be tested for each production crimp height. Data
shall be obtained and recorded for minimum, maximum, and nominal production crimp heights.
2. Samples shall be applied to appropriate cable with overall length no less than 150 mm. 4.4.3样品
1. 至少对于每一个压接高度准备20只样品，对于最大，最小和基本接高度的情况都需记录
下数据
2. 不少于150mm的电缆线/导线用于样品上。 4.4.4 Procedure 4.4.4步骤
1. Pull-out force test shall be performed on leads with the insulation crimp wings open (not crimped).
1.在绝缘体压线脚没有被压接的情况下测量端子的拉脱力。
2. Pull-out force test shall be performed on taut leads (i.e., remove slack in cable before performing pull-out test to prevent incorrect test results due to “jerking”).
测量拉脱力时将力施加在拉紧状态下的导线上（例如，为了在测量是发生突然猛拉的现象影响测试结果的正确性，须在测试前将导线拉紧）
3. Refer to Appendix E, 7-9. Measure and record the conductor crimp and insulation crimp
heights and widths in millimeters for each sample.
参考附件E, 7-9。测量芯线压线脚和绝缘体压线脚的压接高度和宽度，以毫米为单位。 4. If the insulation crimp is not already open, open the insulation crimp with the
de-crimper or other suitable tool so that the pull-out force will reflect only the conductor crimp connection.
4.假如绝缘体压线脚压接了并且没有分开，则需要用合适的工具将绝缘体压线脚分开，这样测试出来的结果才纯粹反映芯线压线脚的拉脱力。（讨论）
5. Visually inspect the de-crimped area to ensure that none of the conductor strands have been damaged. Do not use any samples that have damaged conductor strands.
5.目测检查是否由于将绝缘体压线脚分开时弄坏芯线，弄坏了芯线的样品不能测试芯线压线脚的拉脱力。
6. Measure and record pull-out forces in Newtons for each sample. 6.测量和记录每一个样品的拉脱力，以牛顿为单位。
7. Apply an axial force at a rate between 50 and 250 mm/minute (100 mm/min. is recommended).
7.以50到250mm/min(100mm/min为推荐值)的速度延轴向施加拉力。
8. For double, triple, or multiple crimp setups with conductor sizes within one step, pull the smallest conductor. (e.g. for a .35/.50 double, pull the .35mm2 wire)
8.对于压接双线，三线或多线一次性压接的情况，测量拉脱力时只需测量最小的导线（例如，压接35 mm2 /50 mm2的导线，测量时拉35 mm2的导线。
9. For double, triple, or multiple crimp setups with conductor sizes more than one step apart, each cable must be tested. (e.g. for a .50/1.0 double, pull both wires individually) 9. 对于压接双线，三线或多线分多次压接的情况，则每根导线都需要测量。 10. Calculate the mean and standard deviation using the following formulas: 10.计算平均值和标准偏差用如下公式计算：
对于每一压接高度，报告最小值，最大值，平均值，标准偏差，平均值减去3倍标准偏差。 11. Report any observations from visual examination. 11.目测检查后记录任何的检查结果 4.4.5 Acceptance Criteria 4.4.5接收标准
1. 拉脱力平均值减去3倍标准偏差的数值在表4.4.5中有规定。未列出的导线规格可以通过插补法推测出来。
AWG 截面积（mm2） 和最小拉脱力（N） 0.22 24 40 0.35 22 50（冷拉铜等，一种导线芯线加工工艺）(Annealed Core) 0.35 22 70（退火铜等，一种导线芯线加工工艺）(Hard Drawn Core) 0.5 20 75 0.8 18 90 1.0 16 120 1.5 150 2.0 14 180 2.5 210 3.0 12 240 4.0 265 5.0 10 290 6.0 320 8.0 8 350
TABLE 4.4.5 – Pull-out Force Requirements
表4.4.5—拉脱力要求
4.5 Electrical Performance Tests 4.5电性能测试
4.5.1 Current Cycling of Electrical Terminations (ECC) 4.5.1端子的电流循环试验 4.5.1.1 Purpose
Current cycling is an accelerated aging test that emphasizes the effect of expansion and contraction of terminal interfaces and conductor crimps as a result of thermal cycling. This test
is optional (see table 5.1). The Accelerated Environmental Test (paragraph 4.5.2) may be done
in place of this test for Power applications. (see table 5.1) 4.5.1.1目的
电流循环试验是一个加速老化的试验，它着重强调了热胀冷缩对端子连接处和压接处的影响。这是一个可选试验，加速环境老化试验可以代替该试验（见表5.1和第4.5.2段） 4.5.1.2 Samples 4.5.1.2样品
1. Any engineering development, prototype, or production terminal – particularly those intended for high current or “Power” applications – may be submitted for test.
1.任何工程开发，原型样件或生产的端子，特别是高电流或电源电路中用到的情况，需要时要做该试验。
2. Test data will be collected on 10 samples of each crimp height. Data shall be obtained and recorded for minimum, maximum and nominal production crimp heights.
2.每一压接高度需要收集10只样品的试验数据。需要收集最大，最小和基本压接高度的数据。
3. In cases where mating terminals are available, apply these to the opposite ends of the test sample cables. These should be a minimum cut length of 150mm. The terminal crimps on the mating terminals may be soldered. Samples are then connected to form a continuous series circuit.
3.如果有与该样品相配对的端子，那么连接用的导线长度至少150mm，与该样品配对的端子压线脚处可以通过焊接与导线连接。这样连接就形成了串联电路。
4. Test sample terminals that have no mating terminals should be applied to one end only of the test cable (a minimum cut length of 150 mm). The opposite stripped ends of the samples are then soldered to box or blade of the next sample to form a continuous series circuit.
4.如果试验的端子没有与之配对的端子，则可以通过焊接的方式，将样品的一端与另一样品连接起来形成串联电路。
5. Doubles should be terminated with the test terminal on one end only. A mating terminal may be applied (with the crimp soldered) to the other end of the largest size cable. When identical size cables are doubled, cables should be randomly tested.
5.对于压双线的端子（两导线规格相同），在测量时与之配对的端子可连接在最大导线的另一端（可以通过压接焊接）。对于导线规格相同的情况，任选一导线即可。 4.5.1.3 Equipment
1. Power supply – AC or DC current regulated capable of supplying the test current. 2. Cycle timer.
3. Ammeter or current shunt/voltmeter 4. Voltmeter.
5. Voltage sense lead – solid conductor .32 mm or smaller in diameter. 6. Welder – Tweezer Weld TW-3 or similar device. 7. Terminal test board.
8. Sample with solder added to the conductor crimp (soldered sample). 4.5.1.3设备
1. 能够提供可调的直流或交流的电源 2. 控制循环周期的仪器 3. 电表或电流计/伏特表 4. 伏特计
5. 连接电表导线的直径0.32mm或更小
6. 焊接设备—Tweezer Weld TW-3或类似设备 7. 端子测试板（测试平台）
8. 做焊接样品：将导线的芯线焊接在芯线压线脚处。 4.5.1.4 Procedure 4.5.1.4步骤
1. Perform a visual inspection of components per paragraph 4.2. 1.按照4.2的要求目测检查零件的外观
2. Voltage sense leads are attached to the sample terminals per figure 4.5.1.4. The same location must be used for all samples.
2.微欧计的导线按照如图4.5.1.4连接。所有的样品都按照该连接方式连接
(Note: The V + test lead may be connected to back of insulation wing if wing does not touch the core)
FIGURE 4.5.1.4 – Test Lead Attachment
（注释：如果绝缘体压线脚压接时压线脚两卷边没有刺入芯线，则微欧计导线的V +端可以连接在绝缘体压线脚的末端。）
图4.5.1.4微欧计导线（测试笔）与测试样品的连接图
3. Sense leads are also attached to the test cable at a point 75 ± 3 mm from the rear edge of the conductor crimp.
3.另一测试表笔连接在与芯线压线脚末端相距75 ± 3 mm的导线处 4. Samples are then connected in a series circuit. 4.样品以串联的方式连接起来。
5. The samples are then loosely attached to a test board with a minimum of 35mm between single terminals.
5.样品轻轻的放在试验板上，每个端子至少相距35mm。
6. The series test circuit is connected to the ammeter / current shunt and a
timer-controlled power supply. Include the soldered test sample in the circuit (4.5.1.3-8) The test duration shall be a minimum of 200 ± 8 hours with the test current cycling on for 45 minutes ± 2 minutes and off for 15 minutes ± 2 minutes.
6.串联电路连接到电流表/分流器和有时间控制的电源上。包括电路中焊接连接的试验样品（4.5.1.3-8）。试验持续时间为200 ± 8h，其中每个循环中通电45± 2min，断电15± 2min。 7. The typical test currents are listed in table 4.5.1.4 unless otherwise specified. 7.除非另外规定，否则典型的试验电流按照表4.5.1.4中规定值设置。
AWG 导线规格（mm2） 55℃导线额定电流 0.22 24 6 0.35 22 10 0.5 20 14 0.8 18 18 1.0 16 22 2.0 14 30 3.0 12 40 5.0 10 65 8.0 8 100
*The test currents for conductors sizes not listed above can be defined by linear interpolation
(i.e. read out from plotted values).
TABLE 4.5.1.4 - Test Current for Current Cycling
对于没有列在表中的试验电流可以通过中间插补法推测出来。